Artificially Induced Grain Alignment in Thin Films: Volume 1150 by Vladimir Mati
Thin-film growth is a very old art and an established scientific field in materials science. Topics include: milestones in IBAD texturing; IBAD texturing; IBAD long-length application and texturing by other techniques.
Materials, Processes, Integration and Reliability in Advanced Interconnects for
In 2004, the microelectronics industry quietly ushered in the Nanoelectronics Era with the mass production of sub-100nm node devices. The 90nm node BEOL features copper (Cu) interconnects and dielectric materials with a low-dielectric constant (k) of about 3.0.
Materials Reliability in Microelectronics III: Volume 309 by Kenneth P. Rodbell
By Kenneth P. Rodbell, William F. Filter, Harold J. Frost, Paul S. Ho. Short Title MATERIALS RELIABILITY IN MICRO. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Materials and Physics for Nonvolatile Memories II: Volume 1250 by Caroline Bonaf
By Caroline Bonafos, Yoshihisa Fujisaki, Panagiotis Dimitrakis, Eisuke Tokumitsu. Short Title MATERIALS & PHYSICS FOR NONVOL. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Applied Materials Characterization: Volume 48 by W. Katz (English) Paperback Boo
By W. Katz, P. Williams. Short Title APPLIED MATERIALS CHARACTERIZA. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Format Paperback.
Materials Characterization: Volume 1242 by Antonio Contreras Cuevas (English) Pa
By Antonio Contreras Cuevas, Ramiro Pérez Campos, Rodrigo A. Esparza Muñoz. Preface; Materials Research Society symposium proceedings; Part I. Materials Characterization by X-ray Diffraction, Infrared Spectroscopy, Scanning Electron Microscopy and Transmission Electron Microscopy; Part II.
High-Temperature Ordered Intermetallic Alloys II: Volume 81 by N.S. Stoloff (Eng
By N.S. Stoloff, C.C. Koch, C.T. Liu, O. Izumi. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Short Title HIGH-TEMPERATURE ORDERED INTER.
Beam-Solid Interactions and Phase Transformations: Volume 51 by H. Kurz (English
By H. Kurz, G.L. Olson, J.M. Poate. Short Title BEAM-SOLID INTERACTIONS & PHAS. Format Paperback. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Thin Film Structures and Phase Stability: Volume 187 by B.M. Clemens (English) P
Short Title THIN FILM STRUCTURES & PHASE S. Affiliation California Institute of Technology. Format Paperback. Publisher Cambridge University Press. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Materials Reliability in Microelectronics II: Volume 265 by C.V. Thompson (Engli
Short Title MATERIALS RELIABILITY IN MICRO. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Format Paperback. Edited by J. R. Lloyd.